半導體可靠度測試資料 (含環測專案及觀念)
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半導體可靠度測試資料 (含環測專案及觀念)RELIABILITY TESTING OF SEMICONDUCTOR DEVICES
V. RELIABILITY TESTING OF SEMICONDUCTOR DEVICES
1. WHAT IS RELIABILITY TESTING? 2. RELIABILITY TEST METHODS 3. ACCELERATED LIFE TEST 4. ANALYSIS OF TEST RESULTS
4.1 HOW TO USE WEIBULL PROBABILITY PAPER 3. 3. 3. 3. 3. 4.1.1 APPLICATION OF WEIBULL PROBABILITY PAPER 4.1.2 FORMAT OF WEIBULL PROBABILITY PAPER 4.1.3 PRINCIPLE 4.1.4 PROCEDURE FOR USE 4.1.5 INTERPRETATIONS OF WEIBULL PLOTTING 4.2 HOW TO USE CUMULATIVE HAZARD PAPER 3. 3. 3. 3. 4.2.1 APPLICATION OF CUMULATIVE HAZARD PAPER 4.2.2 FORMAT OF WEIBULL TYPE CUMULATIVE HAZARD PAPER 4.2.3 PRINCIPLE 4.2.4 PROCEDURE FOR USE 4.3 PROCEDURE FOR FAILURE RATE PREDICTION 3. WITH 60% CONFIDENCE LEVEL
RELIABILITY TESTING OF SEMICONDUCTOR DEVICES
V. RELIABILITY TESTING OF SEMICONDUCTOR DEVICES
1. WHAT IS
V. RELIABILITY TESTING OF SEMICONDUCTOR DEVICES
1. WHAT IS RELIABILITY TESTING? 2. RELIABILITY TEST METHODS 3. ACCELERATED LIFE TEST 4. ANALYSIS OF TEST RESULTS
4.1 HOW TO USE WEIBULL PROBABILITY PAPER 3. 3. 3. 3. 3. 4.1.1 APPLICATION OF WEIBULL PROBABILITY PAPER 4.1.2 FORMAT OF WEIBULL PROBABILITY PAPER 4.1.3 PRINCIPLE 4.1.4 PROCEDURE FOR USE 4.1.5 INTERPRETATIONS OF WEIBULL PLOTTING 4.2 HOW TO USE CUMULATIVE HAZARD PAPER 3. 3. 3. 3. 4.2.1 APPLICATION OF CUMULATIVE HAZARD PAPER 4.2.2 FORMAT OF WEIBULL TYPE CUMULATIVE HAZARD PAPER 4.2.3 PRINCIPLE 4.2.4 PROCEDURE FOR USE 4.3 PROCEDURE FOR FAILURE RATE PREDICTION 3. WITH 60% CONFIDENCE LEVEL
RELIABILITY TESTING OF SEMICONDUCTOR DEVICES
V. RELIABILITY TESTING OF SEMICONDUCTOR DEVICES
1. WHAT IS
关键词： 半導 體可 靠度 測試 資料 含環 測專 案及 觀念
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